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Chapter 3 Performance Test RIGOL

Service Guide for DM3058

3-5

Verification Testing

Zero Offset Test

This test is used to inspect the performance of zero offset of the device, and which is

required only when regular offsets happened to function or range.

Verification procedure:

1. Read “Testing Conditions” carefully before start.

2. Short-circuit the Input HI-LO and Sense HI-LO using 4-terminal shortcircuiter and

open circuit of input terminal of current, see as Figure 3-1.

3. Test the functions and ranges listed in Table 3-2 item by item. And then set the

rate of reading as “Slow” and disable all the math operations.

4. Compare the testing results with the test limits listed in table.

Figure 3-1 The Input HI-LO and Sense/Ref HI-LO Terminals in Short Circuit

Table 3-2 Zero Offset of the Standard Equipment

Function

[1]

Range

Input

signal

Quick

Test

Test limits (1 year)

Upper

limit

Lower

limit

DC Voltage

200.000 mV

short

8 μV

-8 μV

2.00000 V

short

60 μV

-60 μV

20.0000 V

short

800 μV

-800μ V

200.000 V

short

6 mV

-6 mV

1000.00 V

short

30 mV

-30 mV

DC Current

200.000 μA

open

10 nA

-10 nA

2.00000 mA

open

100 nA

-100 nA

20.0000 mA

open

4 μA

-4 μA

200.000 mA

open

16 μA

-16 μA

2.00000 A

open

400 μA

-400 μA

10.0000 A

open

1 mA

-1 mA

1 2 ... 28 29 30 31 32 33 34 35 36 37 38 ... 77 78

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